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14 Feb 2022
A four-point probe (with probe spacing of 0.5 mm) is used to measure the resistivity of a type silicon sample. Find the resistivity of the sample if its diameter is 200 mm and its thickness is 50 µm. The contact current is 1 mA, and the measured voltage between the
inner two probes is 10 mV.
A four-point probe (with probe spacing of 0.5 mm) is used to measure the resistivity of a type silicon sample. Find the resistivity of the sample if its diameter is 200 mm and its thickness is 50 µm. The contact current is 1 mA, and the measured voltage between the
inner two probes is 10 mV.
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28 Jul 2023
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14 Feb 2022
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