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11 Nov 2021

Background and context

Specimens are enhanced and analyzed by using electron beams generated by electromagnets in an electron microscope.Whereas in a light microscope, light passes through the object and is visualised under a microscope .Scanning electron microscopes (SEMs) have more resolution and surface of objects can be visualised in three dimensions. High-resolution cross-sections of objects are produced by transmission electron microscopes (TEM).

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